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Photolithography - Technology

Photolithography - Technology: Encyclopedia II - Photolithography - Technology

A wafer is introduced onto an automated "wafertrack" system. This track consists of handling robots, bake/cool plates, and coat/develop units. The robots are used to transfer wafers from one module to another. The wafer is initially heated to a temperature sufficient to drive off any moisture that may be present on the wafer surface. Hexa-methyl-disilizane (HMDS) is applied in either liquid or vapor form in order to promote better adhesion of the photosensitive polymeric material, called photoresist. Photoresist is dispensed in a liquid form ...

See also:

Photolithography, Photolithography - Technology

Photolithography, Photolithography - Technology, Nanolithography, Soft lithography

Photolithography: Encyclopedia II - Photolithography - Technology



Photolithography - Technology

A wafer is introduced onto an automated "wafertrack" system. This track consists of handling robots, bake/cool plates, and coat/develop units. The robots are used to transfer wafers from one module to another. The wafer is initially heated to a temperature sufficient to drive off any moisture that may be present on the wafer surface. Hexa-methyl-disilizane (HMDS) is applied in either liquid or vapor form in order to promote better adhesion of the photosensitive polymeric material, called photoresist. Photoresist is dispensed in a liquid form onto the wafer as it undergoes rotation. The speed and acceleration of this rotation are important parameters in determining the resulting thickness of the applied photoresist. The photoresist-coated wafer is then transferred to a hot plate, where a "soft bake" is applied to drive off excess solvent before the wafer is introduced into the exposure system.

The desired pattern is then projected onto the wafer in either a machine called a stepper or scanner. The stepper/scanner functions similarly to a slide projector. Light from a mercury arc lamp or excimer laser is focused through a complex system of lenses onto a "mask" (also called a reticle), containing the desired image. The light passes through the mask and is then focused to produce the desired image on the wafer through a reduction lens system. The reduction of the system can vary depending on design, but is typically on the order of 4X-5X in magnitude.

When the image is projected onto the wafer, the photoresist material undergoes some wavelength-specific radiation-sensitive chemical reactions, which cause the regions exposed to light to be either more or less acidic. If the exposed regions become more acidic, the material is called a positive photoresist, while if it becomes less susceptible it is a negative photoresist. The resist is then "developed" by exposing it to an alkaline solution that removes either the exposed (positive photoresist) or the unexposed (negative photoresist). This process takes place after the wafer is transferred from the exposure system back to the wafertrack.

Developers originally often contained sodium hydroxide (NaOH). However, sodium is considered an extremely undesirable contaminant in MOSFET fabrication because it degrades the insulating properties of gate oxides. Metal-ion-free developers such as tetramethyl ammonium hydroxide (TMAH) are now used.

A post-exposure bake is performed before developing, typically to help reduce standing wave phenomena caused by the destructive and constructive interference patterns of the incident light. The develop chemistry is delivered in a similar fashion to how the photoresist was applied. The resulting wafer is then "hardbaked" on a bake plate at high temperature in order to solidify the remaining photoresist, to better serve as a protecting layer in future ion implantation, wet chemical etching, or plasma etching.

The ability to project a clear image of a very small feature onto the wafer is limited by the wavelength of the light that is used and the ability of the reduction lens system to capture enough diffraction orders from the illuminated mask. Current state-of-the-art photolithography tools use deep ultraviolet (DUV) light with wavelengths of 248 and 193 nm, which allow minimum resist feature sizes down to 65nm.

Optical lithography can be extended to feature sizes below 65nm using 193nm and liquid immersion techniques. Also termed immersion lithography, this enables the use of optics with numerical apertures exceeding 1.0. The liquid used is typically ultra-pure, deionised water, which provides for a refractive index above that of the usual air gap between the lens and the wafer surface. This is continually circulated to eliminate thermally-induced distortions. Using water will only allow NA's of up to ~1.4 but higher refractive index materials will allow the effective NA to be increased.

Tools using 157nm wavelength DUV in a manner similar to current exposure systems have been developed. These were once targeted to succeed 193nm at the 65nm feature size node but have now all but been eliminated by the introduction of immersion lithography. This was due to persistent technical problems with the 157nm technology and economic considerations that provided strong incentives for the continued use of 193nm technology. Beyond the 45nm node Extreme ultraviolet lithography may be required. EUV lithography systems are currently under development which will use 13.5nm wavelengths, approaching the regime of x-rays.

The image for the mask is originated from a computerized data file. This data file is converted to a series of polygons and written onto a square fused quartz substrate covered with a layer of chrome using a photolithographic process. A beam of electrons is used to expose the pattern defined in the data file and travels over the surface of the substrate in either a vector or raster scan manner. Where the photoresist on the mask is exposed, the chrome can be etched away, leaving a clear path for the light in the stepper/scanner systems to travel through.

Optical lithography can be extended to a resolution of 15 nm by using the short wavelengths of 1 nm X-ray lithography for the illumination. The technique is developed to the extent of batch processing. The extension of the method relies on Near Field X-rays in Fresnel diffraction: a clear mask feature is "demagnified" by proximity to a wafer that is set near to a "Critical Condition." This Condition determines the mask-to-wafer Gap and depends on both the size of the clear mask feature and on the wavelength. The method is rapid because it uses broadband, and simple because it requires no lenses.

Work is in progress on an optical maskless lithography tool. This uses a digital micro-mirror array to directly manipulate reflected light without the need for an intervening mask. Throughput is inherently low, but the elimination of mask-related production costs - which are rising exponentially with every technology generation - means that such a system would be far more cost-effective for small-scale manufacturing applications.




Adapted from the Wikipedia article "Technology", under the G.N U Free Docmentation License. Please also see http://en.wikipedia.org/wiki

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